Pentax 2011 Annual Report Download - page 8
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Advances in scaling down design rules (the width of
circuit lines) have been critical to making
semiconductor devices with greater circuit density.
In the past, line width was measured in microns, which
is short for micrometer (one thousandth of a
millimeter). Today, semiconductor makers use
nanometers (one millionth of a millimeter) instead. The
switch to nanometers, which are used to express the
size of molecules and atoms, demonstrates the
exacting demands now placed on semiconductor miniaturization.
Miniaturization is now measured in molecules and even atoms
HOYA Annual Re
p
ort 2011