AMD 1998 Annual Report Download - page 49

AMD/Motorola Technology Development and License Agreement
December 3, 1998 - Execution Document
1.32. "Strategic Party" means a third party with whom a party to
this Agreement has a relationship to jointly develop and/or
design products or devices or portions of products or devices.
1.33. ***** means a party to this Agreement providing information,
training and support to a ***** of such party regarding a
Logic Process Technology, Embedded Flash Technology, or other
semiconductor manufacturing process developed and/or licensed
under this Agreement, and *****.
1.34. "Subsidiary" means a corporation, company, or other entity:
(a) more than forty percent (40%) of whose outstanding
shares or securities (representing the right to vote
for the election of directors or other managing
authority) are now or hereafter, owned or controlled,
directly or indirectly, by a party hereto, but such
corporation, company, or other entity shall be deemed
to be a Subsidiary only so long as such ownership or
control exists;
(b) which does not have outstanding shares or securities,
as may be the case in a partnership, joint venture or
unincorporated association, but more than forty
percent (40%) of whose ownership interest
representing the right to make the decisions for such
corporation, company, or other entity is now or
hereafter, owned or controlled, directly or
indirectly, by a party hereto, but such corporation,
company, or other entity shall be deemed to be a
Subsidiary only so long as such ownership or control
exists.
1.35. "Technical Coordinator" means a technical manager who is an
employee of a party and is responsible for managing the
day-to-day development effort of a Project as set forth in
Section 2.4.
1.36. "Test Technology Know How" means the methods and techniques
provided to Motorola by AMD used to produce highly reliable
flash products at cost effective test times, including: stress
modes designed into the product; the characterization
techniques used to determine the conditions used in the stress
modes and their implementation into the production test
routines; the method of characterizing and testing the program
distribution and erase distribution in the product and the
application of this data in the test program that achieves
program and
***** Certain information on this page has been omitted and filed separately
with the Securities and Exchange Commission. Confidential treatment has been
requested with respect to the omitted portions.
Page 7
Source: ADVANCED MICRO DEVIC, 10-K, March 29, 1999