Nikon 2002 Annual Report Download - page 13

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11
ECLIPSE TE2000
Inverted research microscope featur-
ing flexible expandability for multiple
applications
DIGITAL ECLIPSE C1
Modular confocal microscope system
providing a high-contrast image of inter-
cellular structure
OPTISTATION-3100
IC wafer inspection system for
300-mm IC wafers
NRM-3000
Overlay measuring system for
process management support of
300-mm IC wafers