Olympus 2003 Annual Report Download - page 18
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RESEARCH
AND DEVELOPMENT
Based on its core competence in OPTO -Digital Technology,
Olympus engages in research and development in the imaging,
medical and industrial fields to provide new value to society.
In fiscal , Olympus committed ¥.billion to research
and development in imaging information technologies to keep
pace with advances in information technology and networking,
technologies for futuristic medical treatment in the genome field,
and nano technologies that support these endeavors. In particu-
lar, the Company is emphasizing research and development in
the areas of micro-electromechanical systems (MEMS) and
micro-assembly.
Research Results
Olympus’ s research activities in fiscal resulted in the world’s
first successful observance of a living cell with an atomic force
microscope (AFM). W hen the field of life sciences begins to
manipulate biological cells on the DNA level, observation equip-
ment will be needed with precision on the atomic and subatom-
ic levels. Olympus was able to achieve extremely high levels of
sensitivity in AFM through the use of a miniaturized probe.
Olympus also succeeded in the development of a prototype
digital video camera with an ultra-high resolution of megapix-
els. The Company expects this new digital video camera to be
used in digital cinema and for medical applications. Olympus also
developed Vision Plex technology for video image correction
equipment. This new technology enables the seamless projection
of high-resolution digital images on large screens by aligning a
collection of multiple projector images.
OLYMPUS 2003
(%)
.
.
.
.
( )
vision pl ex t ech -
nol ogy for video
image cor r ect ion
equipment
This SXGA-
compatible, automat-
ed video image cor-
rection equipment is
able to display high-
definition images
with megapixels on
a large screen by
arranging a number
of different projector
images.
8megapixels
devel opment of a
st age f or 3d mea-
sur ement s usin g
an at omic f or ce
micr oscope
The stage provides a
wide viewing area of
micrometers and
high resolution of
. nanometers,
enabling highly reli-
able D measure-
ments.
0 .0 4 nm
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